System Design of Automated VLSI (Very Large Scale Integrated) Test Station and Implementation of Selected System Aspects.
A system design to ascertain correct functioning of a VLSI circuit by using Standard IC Tester, (developed at Standford University, California), which has the capability of addressing, simulating, and measuring status of any pin of its test connector, to which an ICUT (IC Under Test) is attached.
Abstract
Abstract : Automated Test Station for VLSI (ATV) is a system design to ascertain correct functioning of a VLSI circuit. It is intended to test an Integrated Circuit (VLSI) by using Standard IC Tester, (developed at Standford University, California). The tester has the capability of addressing, simulating, and measuring status of any pin of its test connector, to which an ICUT (IC Under Test) is attached. The test vectors to simulate the ICUT and reference data to analyze the response of an ICUT are extracted from ESIM files in VAX-11/780 computer system and stored on 8 in. floppy disks to be utilized with microcomputer. These ESIM files, typically produced during Computer Aided Design phase of a VLSI circuit, contain node data generated during its simulator run. The LSI-11/23 microcomputer will be used to control the functions of IC tester and provide test and reference data. The user will have the capability to guide the course of operation by selecting various operating options in an interactive manner. Originator-supplied keywords include: VLSI testing; Microcomputer; and Computer programs.