Design for Testability of Very Large Scale Integrated-Circuit and Application Strategy
88 Citations•2005•
Liu Feng
Electronics Process Technology
The scan path solution, the built-in self test solution and the boundary scan solution of design for testability are summarized and the character and application strategy of these solutions are analyzed.
Abstract
With the increase of the scale of integrated circuits,design for testability of IC is becoming more and more important.We summarize the scan path solution,the built-in self test solution and the boundary scan solution of design for testability,analyse and compare the character and application strategy of these solutions.